IEC 60147-2A:1969
Superseded
View Superseded by
Supplement A - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
Hardcopy , PDF
English - French
01-01-1969
07-23-2013
IEC 60747-1:2006+AMD1:2010 CSV
IEC 60747-6:2016
IEC 60747-2:2016
| DocumentType |
Standard
|
| Pages |
33
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
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