IEC 60147-2C:1970
Withdrawn
Supplement C - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods -Part 2: General principles of measuring methods
Hardcopy , PDF
English - French
01-01-1970
12-31-2021
Deals with transistors and considers collector-base capacitance of transistors, gives voltage ratings and measurable characteristics limiting the working voltages, indicates methods of measuring thermal resistance and defines switching and high-frequency parameters.
| DocumentType |
Standard
|
| Pages |
73
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Withdrawn
|
| Standards | Relationship |
| NEN 10147-2 : 1986 | Identical |
| NEN EN 100012 : 1995 | Identical |
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