IEC 60147-2M:1980
Withdrawn
Supplement M - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods -Part 2: General principles of measuring methods
Hardcopy , PDF
English - French, Russian
01-01-1980
12-31-2021
Deals with measuring methods for signal and voltageregulator diodes, bipolar and field-effect transistors. Some methods, formerly described, are brought up to date according to more modern techniques or equipment; some others are newly described.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| Pages |
73
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Withdrawn
|
| Standards | Relationship |
| NEN 10147-2 : 1986 | Identical |
| NEN EN 100012 : 1995 | Identical |
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