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IEC 60444-11:2010

Superseded

Superseded

View Superseded by

Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction

Available format(s)

Hardcopy , PDF

Language(s)

English, English - French

Published date

10-07-2010

Superseded date

04-22-2026

US$114.00
Excluding Tax where applicable

IEC 60444-11:2010 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.

Committee
TC 49
DevelopmentNote
Stability Date: 2017. (09/2017)
DocumentType
Standard
Pages
32
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

CEI EN IEC 63041-1:2022 Piezoelectric sensors Part 1: Generic specifications

IEC 60444-5:1995 Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
IEC TR 60444-4:1988 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification

US$114.00
Excluding Tax where applicable