IEC 60653:1979
Superseded
View Superseded by
General considerations on ultrasonic cleaning
Hardcopy , PDF
English - French
01-01-1979
09-01-2001
NO CONTENTS AVAILABLE
Contains an 'experimental' standard defining an ultrasonic cleaning exposure test designed to determine the ability of components and equipment to withstand the effects of ultrasonic cleaning. Has the status of a technical report.
| DocumentType |
Standard
|
| Pages |
13
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| DIN IEC 60068 Beiblatt 10:1985-08 | Identical |
| NEN NPR 10653 : 1980 | Identical |
| CEI 50-9 : 1997 | Identical |
| UNE 20653:1982 | Identical |
| DIN IEC 60068 Beiblatt 10:1985-08 | Corresponds |
| BS EN 60068-2-45:1993 | Environmental testing. Test methods Environmental testing. Tests. Test XA and guidance. Immersion in cleaning solvents |
| BS EN 60749:1999 | Semiconductor devices. Mechanical and climatic test methods |
| BS CECC 90000:1991 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
| NF EN 60068 2-45 : 1993 AMD 1 1994 | ENVIRONMENTAL TESTING - PART 2: TESTS - TEST XA AND GUIDANCE: IMMERSION IN CLEANING SOLVENTS |
| CEI EN 60068-2-45 : 2001 | BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST XA AND GUIDANCE: IMMERSION IN CLEANING SOLVENTS |
| EN 60749 : 99 AMD 2 2001 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS |
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