IEC 60748-11-1:1992
Current
Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
Hardcopy , PDF
English - French, Russian
04-01-1992
FOREWORD
Clause
1 Scope and object
2 Apparatus
3 Procedure for integrated circuits
3.0 Introduction
3.1 Test conditions
3.2 Specified conditions
Figures
The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.
| Committee |
TC 47/SC 47A
|
| DevelopmentNote |
Supersedes IEC 60186B. (07/2004) Also numbered as BS QC790101(1992) (08/2005) Stability Date: 2021. (11/2017)
|
| DocumentType |
Standard
|
| Pages |
71
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| GOST R IEC 748-11-1 : 2001 | Identical |
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