IEC 60749-27:2006/AMD1:2012
NA
NA
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Amendment of
Available format(s)
Hardcopy , PDF
Language(s)
English - French
Published date
09-25-2012
Publisher
US$14.00
Excluding Tax where applicable
| Committee |
TC 47
|
| DocumentType |
Amendment
|
| Pages |
5
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
NA
|
| Standards | Relationship |
| BS EN 60749-27:2006+A1:2012 | Identical |
Summarise
US$14.00
Excluding Tax where applicable
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