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IEC 60749-7:2011

Superseded

Superseded

View Superseded by

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

Available format(s)

Hardcopy , PDF

Language(s)

English - French

Published date

06-17-2011

Superseded date

11-27-2025

Superseded by

IEC 60749-7:2025

US$57.00
Excluding Tax where applicable
Summarise this standard

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Failure criteria
7 Implementation
8 Summary
Bibliography

IEC 60749-7:2011 specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive. This second edition cancels and replaces the first edition published in 2002 and constitutes a technical revision. This second edition has been completely re-written so as to align it with the text of the latest versions of MIL-STD-750, method 1018 and MIL-STD-883, method 1018. The main change is the removal of the two alternative methods formerly designated method 2 and method 3.

Committee
TC 47
DevelopmentNote
Supersedes IEC 60749. (03/2008) Stability Date: 2020. (09/2017)
DocumentType
Standard
Pages
21
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy
Supersedes

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US$57.00
Excluding Tax where applicable