IEC 60776:1983
Withdrawn
Expression of the properties of logic analyzers
Hardcopy , PDF
English - French
01-01-1983
12-31-2021
FOREWORD
PREFACE
Clause
1. Scope
2. Object
SECTION ONE - DEFINITIONS
3. General terms
4. Terms related to triggering
5. Terms related to acquisition
6. Terms related to data representation
SECTION TWO - GENERAL TEST REQUIREMENTS
7. General
8. Statement of limits of errors
9. Performance to be verified and checked
10. Combinations of mainframe with plug-ins
11. Conditions for test location
12. Type tests
13. General conditions for test purposes
14. Standard values and ranges of influence quantities
15. Preparation for tests
16. Particular conditions
17. Reference conditions
SECTION THREE - TEST PROCEDURES
18. Sensitivity
19. Maximum clock rate
20. Set-up time
21. Hold time
22. Glitch recognition
FIGURES
INDEX OF TERMS
Lays down uniform methods of expression of the properties of logic analyzers, and more particularly: -defines special terminology and catalogue data related to these types of apparatus; -specifies conditions and methods for testing these types of apparatus in order to verify compliance with propertiesclaimed or specified by the manufacturer.
| DevelopmentNote |
Also numbered as BS 6653(1985) (09/2005)
|
| DocumentType |
Standard
|
| Pages |
33
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Withdrawn
|
| Standards | Relationship |
| DIN IEC 60776:1987-01 | Identical |
| NFC 42 695 : 1985 | Identical |
| NEN 10776 : 1986 | Identical |
| CEI 66-4 : 1997 | Identical |
| BIS IS 12350 : 1987(R2002) | Identical |
| HD 469 : 200S1 | Identical |
| UNE 20776:1996 | Identical |
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