IEC 60793-1-2:1995
Superseded
View Superseded by
Optical fibres - Part 1: Generic specification - Section 2: Measuring methods for dimensions
Hardcopy , PDF
11-22-1995
08-01-2001
FOREWORD
Clause
1 Scope and object
2 Normative reference
3 Dimensional tests
4 Reference surface
5 Concentricity error
6 Tolerances
7 Operational definitions
8 Method IEC 793-1-A1 - Refractive index profile
8.1 Method IEC 60793-1-A1A - Refractive index
profile - Refracted near-field method
8.2 Method IEC 60793-1-A1B - Refractive index
profile, transverse interference method
9 Method IEC 793-1-A2 - End face geometry of optical
fibre determined from the near-field light
distribution
9.1 Object
9.2 Geometry parameters
9.3 Apparatus
9.4 Test sample
9.5 Procedure
9.6 Results
10 Method IEC 793-1-A3 - Side view light distribution
for primary coating
10.1 Object
10.2 Sample preparation
10.3 Apparatus
10.4 Procedure
11 Method IEC 793-1-A4 - Mechanical diameter measurement
11.1 Object
11.2 Scope
11.3 Test apparatus
12 Method IEC 793-1-A5 - Mechanical length measurement
13 Method IEC 793-1-A6 - Length measurement by delay
measuring of transmitted pulse and/or reflected pulse
13.1 Object
13.2 Principle
13.3 Sample
13.4 Apparatus
13.5 Procedure
13.6 Results
13.7 Documentation
14 Method IEC 793-1-A7 - Fibre elongation measurement
method
14.1 Object
14.2 Description
14.3 Apparatus
14.4 Procedure
14.5 Results
15 Method IEC 60793-1-A8 - Length measurement of an
optical fibre by the phase-shift method
15.1 Object
15.2 Scope
15.3 Apparatus
15.4 Sampling and specimens
15.5 Procedure
15.6 Calculation and interpretation of results
15.7 Documentation
Annex A (informative) Determination of group index
Figures
Gives the measureing methods applicable to environmental tests of optical fibres. The methods are to be used for inspection of optical fibres for commercial puposes. They establish uniform requirements for geometrical characteristics of optical fibres.
| DevelopmentNote |
Supersedes IEC 60793 PT1 (1992)
|
| DocumentType |
Standard
|
| Pages |
107
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| NEN IEC 60793-1-2 : 1999 AMD 2 2000 | Identical |
| NEN-IEC 60793-1-2:1999 | Identical |
A newer version of this standard is available.
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