IEC 61164:1995
Superseded
View Superseded by
Reliability growth - Statistical test and estimation methods
Hardcopy , PDF
English - French
06-27-1995
12-31-2021
This standard gives models and numerical methods for reliability growth assessments based on failure data from a single system which were generated in a reliability improvement programme.
| Committee |
TC 56
|
| DocumentType |
Standard
|
| Pages |
61
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| BS 5760-17:1995 | Identical |
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