IEC 61300-3-16:2003

FOREWORD
1 Scope
2 Normative reference
3 General description
4 Apparatus
  4.1 Method 1 - Two-dimensional surface analysis
      4.1.1 Ferrule holder
      4.1.2 Positioning stage
      4.1.3 Two-dimensional surface analyzer
  4.2 Method 2 - Two-dimensional surface analysis by
                 interferometry system
      4.2.1 Ferrule holder
      4.2.2 Positioning stage
      4.2.3 Two-dimensional interferometry analyzer
  4.3 Method 3 - Three-dimensional surface analysis by
                 interferometry system
      4.3.1 Ferrule holder
      4.3.2 Positioning stage
      4.3.3 Three-dimensional interferometry analyzer
5 Procedure
  5.1 Measurement region
  5.2 Method 1 - Two-dimensional surface analysis
  5.3 Method 2 - Two-dimensional surface analysis by
                 interferometry system
  5.4 Method 3 - Three dimensional surface analysis by
                 interferometry system
6 Details to be specified
  6.1 Method 1 - Two-dimensional surface analysis
  6.2 Method 2 - Two-dimensional surface analysis by
                 interferometry system
  6.3 Method 3 - Three-dimensional surface analysis by
                 interferometry system

Describes a procedure to measure the endface radius of a spherically polished ferrule and angled ferrule or an angled spherically polished ferrule.