IEC 61649:1997
Superseded
View Superseded by
Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
Hardcopy , PDF
English - French, Spanish, Castilian
05-16-1997
09-12-2022
Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.
| Committee |
TC 56
|
| DocumentType |
Standard
|
| Pages |
31
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| UNE-IEC 61649:2004 | Identical |
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