IEC 61747-1:1998+AMD1:2003 CSV

FOREWORD
1 Scope
2 Normative references
3 Terminology
  3.1 Physical concepts
  3.2 General terms
  3.3 Terms related to ratings and characteristics
4 Technical aspects
  4.1 Order of precedence
  4.2 Terminology, units and symbols
  4.3 Preferred values of temperature, humidity and pressure
  4.4 Marking
       4.4.1 Device identification
       4.4.2 Device traceability
       4.4.3 Packing
  4.5 Categories of assessed quality
  4.6 Screening
  4.7 Handling
5 Quality assessment procedures
  5.1 Eligibility for qualification approval
       5.1.1 Primary stage of manufacture
  5.2 Commercially confidential information
  5.3 Formation of inspection lots
  5.4 Structurally similar devices
  5.5 Granting of qualification approval
  5.6 Quality conformance inspection
       5.6.1 Division into groups and subgroups
       5.6.2 Inspection requirements
       5.6.3 Supplementary procedure for reduced inspection
       5.6.4 Sampling requirements for small lots
       5.6.5 Certified records of released lots (CRRL)
       5.6.6 Delivery of devices subjected to destructive or
             non-destructive tests
       5.6.7 Delayed deliveries
       5.6.8 Supplementary procedure for deliveries
  5.7 Statistical sampling procedures
       5.7.1 AQL sampling plans
       5.7.2 LTPD sampling plans
  5.8 Endurance tests
  5.9 Endurance tests where the failure rate is specified
       5.9.1 General
       5.9.2 Selection of samples
       5.9.3 Failure
       5.9.4 Endurance test time and sample size
       5.9.5 Procedure to be used if the number of failures
             exceeds the acceptance number
  5.10 Accelerated test procedures
  5.11 Capability approval
6 Test and measurement procedures
  6.1 Standard atmospheric conditions for electrical and
       optical measurements
  6.2 Physical examination
       6.2.1 Visual examination
       6.2.2 Dimensions
       6.2.3 Permanence of marking
  6.3 Electrical and optical measurements
       6.3.1 General conditions and precautions
  6.4 Environmental tests
Annex A (informative) Cross references index
Annex B (informative) Examples of outline drawings of
                      liquid-crystal display cells
Annex C (normative) Orientation of LCD modules
Annex D (normative) Lot tolerance percentage defective
                      (LTPD) sampling plans
Bibliography

Defines general procedures for quality assessment to be used in the IECQ system and gives general rules for measuring methods of electrical and optical characteristics, rules for climatic and mechanical tests, and rules for endurance tests.This consolidated version consists of the first edition (1998) and its amendment 1 (2003). Therefore, no need to order amendment inaddition to this publication.