IEC 61967-4:2002
Superseded
View Superseded by
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method
Hardcopy , PDF
04-30-2002
12-31-2021
Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
The contents of the corrigendum 1 of June 2017 have been included in this copy.
| Committee |
TC 47/SC 47A
|
| DocumentType |
Standard
|
| Pages |
72
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| I.S. EN 61967-4:2002 | Equivalent |
| UNE-EN 61967-4:2002/A1:2006 | Identical |
| UNE-EN 61967-4:2002/AC:2017-07 | Identical |
| UNE-EN 61967-4:2002 | Identical |
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