IEC 62276:2005
Superseded
View Superseded by
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Hardcopy , PDF
English
05-30-2005
12-31-2021
Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.
| DocumentType |
Standard
|
| Pages |
34
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| UNE-EN 62276:2005 | Identical |
| BS EN 61800-7-304:2008 | Identical |
| UNE-EN 62276:2013 | Identical |
| BS EN 62276:2005 | Identical |
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