IEC 62433-2:2017
Current
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
Hardcopy , PDF
English - French
01-27-2017
IEC 62433-2:2017 specifies macro-models for an Integrated Circuit (IC) to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model - Conducted Emission (ICEM-CE). The ICEM-CE macro-model can also be used for modelling an IC-die, a functional block and an Intellectual Property (IP) block. The ICEM-CE macro-model can be used to model both digital and analogue ICs. This edition includes the following significant technical changes with respect to the previous edition:
Incorporation of an XML based exchange format for model representation.
| Committee |
TC 47/SC 47A
|
| DevelopmentNote |
Stability Date: 2021. (02/2017)
|
| DocumentType |
Standard
|
| Pages |
217
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NEN EN IEC 62433-2 : 2017 | Identical |
| PN EN 62433-2 : 2017 | Identical |
| DIN EN 62433-2 : 2010 | Identical |
| VDE 0847-33-2:2017-10 | Identical |
| BS EN 62433-2:2017 | Identical |
| CEI EN 62433-2 : 2011 | Identical |
| NF EN 62433-2 : 2017 | Identical |
| EN 62433-2:2017 | Identical |
| DIN EN 62433-2:2017-10 | Identical |
| I.S. EN 62433-2:2017 | Equivalent |
| CEI EN 62433-2:2017-09 | Identical |
| UNE-EN 62433-2:2017 | Identical |
| NBN EN 62433-2 : 2010 | Identical |
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