IEC 63287-2:2023
Current
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Hardcopy , PDF
English - French
03-29-2023
IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| Pages |
30
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| I.S. EN IEC 63287-2:2023 | Equivalent |
| BS EN IEC 63287-2:2023 | Equivalent |
| UNE-EN IEC 63287-2:2023 | Equivalent |
| DS/EN IEC 63287-2:2023 | Identical |
| CEI EN IEC 63287-2:2023 | Identical |
| UNE-EN IEC 63287-2:2023 | Identical |
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