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IEC PAS 62173:2000

Superseded

Superseded

View Superseded by

Solderability test method

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

08-22-2000

Superseded date

03-15-2004

Superseded by

IEC 60749-21:2011

US$164.00
Excluding Tax where applicable

1 Purpose
2 Apparatus
  2.1 Solder pot
  2.2 Dipping device
  2.3 Optical equipment
  2.4 Steam aging equipment
  2.5 Lighting equipment
  2.6 Materials
  2.7 SMD reflow equipment
3 Procedure for simulated board mounting reflow
  solderability test in SMDs
  3.1 Test equipment set-up
  3.2 Specimen preparation and surface condition
  3.3 Visual inspection
4 Procedure for dip and look solderability testing
  4.1 Preconditioning
  4.2 Solder dip conditions
  4.3 Testing
5 Summary
Figures
Tables

Provides a means of determining the solderability of device package terminations that are intended to be joined to another surface using solder for the attachment.Provides also optional conditions for ageing and soldering for the purpose of allowing simulation of the soldering process to be used in the device application.

DocumentType
Miscellaneous Product
Pages
17
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

US$164.00
Excluding Tax where applicable