IEC PAS 62175:2000
Superseded
View Superseded by
Marking permanency test method
Hardcopy , PDF
English
08-24-2000
04-12-2002
Verifies that the markings on solid state semiconductor devices will not become illegible when subjected to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.
| DevelopmentNote |
JOINT STANDARD DEVELOPED BY EIA/JEDEC - DOCUMENT IS ALSO AVAILABLE AS EIA/JESD 22-B107 (09/2000)
|
| DocumentType |
Miscellaneous Product
|
| Pages |
5
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
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