IEC PAS 62180:2000
Superseded
View Superseded by
Electrostatic discharge (ESD) sensitivity testing machine model (MM)
Hardcopy , PDF
English
08-22-2000
10-21-2003
FOREWORD
1 Purpose
2 Apparatus
3 Qualification, calibration and waveform verification
4 Classification procedure
5 Failure criteria
6 Classification criteria
Establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined machine Model (MM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable MM ESD test results so that accurate classifications can be performed.
| DocumentType |
Miscellaneous Product
|
| Pages |
12
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
A newer version of this standard is available.
View Current Edition
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.