IEC PAS 62189:2000
Superseded
View Superseded by
Bias Life
Hardcopy , PDF
English
11-28-2000
02-23-2004
FOREWORD
1 Purpose
2 Apparatus
3 Procedure
4 Cool-down
5 Measurements
6 Failure criteria
7 Summary
This test is performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device qualification and reliability monitoring.
| DocumentType |
Miscellaneous Product
|
| Pages |
6
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NEN NPR IEC/PAS 62189 : 2001 | Identical |
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