IEC PAS 62205:2000
Superseded
View Superseded by
High temperature storage life
Hardcopy , PDF
English
11-28-2000
04-12-2002
FOREWORD
1 Purpose
2 Apparatus
3 Procedure
4 Summary
Aims at determining the effect on solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is considered destructive.
| DocumentType |
Miscellaneous Product
|
| Pages |
3
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NEN NPR IEC/PAS 62205 : 2001 | Identical |
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