IEC PAS 62206:2000
Superseded
View Superseded by
Power and temperature cycling
Hardcopy , PDF
English
11-28-2000
03-10-2004
FOREWORD
1 Purpose
2 Apparatus
3 Procedure
4 Failure criteria
5 Summary
Aims at determining the ability of a device to withstand alternate exposures at high and low temperature extremes with operating biases periodically applied and removed. It is intended to simulate worst case conditions encountered in typical applications and considered destructive.
| DocumentType |
Miscellaneous Product
|
| Pages |
5
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NEN NPR IEC/PAS 62206 : 2001 | Identical |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.