IEC PAS 62277:2001
Superseded
View Superseded by
Test-fixture of surface mounting quartz crystal units
Hardcopy , PDF
English
08-28-2001
07-04-2003
1 Introduction
2 Scope
3 Application
4 General issue
5 Leadless surface mounting quartz crystal units
5.1 Enclosure
5.2 Overtone and frequency range
6 Specifications of measurement method, test-fixture
6.1 Specifications of measurement method
6.2 Specifications of test-fixture
7 Calibration of measurement system and C[L] adapter board
7.1 Calibration of measurement system
7.2 Calibration of C[L] adapter board
Reference
Describes the test-fixture that allows the accurate measurement of resonance frequency, resonance resistance, and electrical-equivalent-circuit constants of a leadless surface mounting quartz crystal using the zero phase technique as specified in IEC 60444.
| DevelopmentNote |
Also numbered as BS PD IEC/PAS 62277. (02/2002)
|
| DocumentType |
Miscellaneous Product
|
| Pages |
11
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NEN NPR IEC/PAS 62277 : 2001 | Identical |
| IEC 60444-5:1995 | Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
| IEC TR 60444-4:1988 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz |
| IEC 61240:2016 | Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules |
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