IEC PAS 62562:2008
Superseded
View Superseded by
Cavity resonator method to measure the complex permittivity of low-loss dielectric plates
Hardcopy , PDF
English
01-22-2008
02-18-2010
FOREWORD
1 Scope
2 Measurement parameters
3 Theory and calculation equations
3.1 Relative permittivity and loss tangent
3.2 Temperature dependence of varepsilon and tan delta
3.3 Cavity parameters
4 Measurement equipment and apparatus
4.1 Measurement equipment
4.2 Measurement apparatus for complex permittivity
5 Measurement procedure
5.1 Preparation of measurement apparatus
5.2 Measurement of reference level
5.3 Measurement of cavity parameters: D, H, sigma[r],
alpha[c], TC[rho]
5.4 Measurement of complex permittivity of test specimen:
varepsilon, tan delta
5.5 Temperature dependence of varepsilon and tan delta
Annex A (informative) Example of measured result and accuracy
A.1 Cavity parameters
A.2 Relative permittivity varepsilon and loss tangent tan delta
A.3 Measurement accuracy
Bibliography
Describes the measurement method of dielectric properties in the planer direction of dielectric plate at microwave frequency in order to develop new materials and to design microwave active and passive devices. This method is called a cavity resonator method.
| DocumentType |
Miscellaneous Product
|
| Pages |
17
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NEN NPR IEC/PAS 62562 : 2008 | Identical |
| DD IEC PAS 62562 : DRAFT 2008 | Identical |