• Shopping Cart
    There are no items in your cart

IEC PAS 62562:2008

Superseded

Superseded

View Superseded by

Cavity resonator method to measure the complex permittivity of low-loss dielectric plates

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-22-2008

Superseded date

02-18-2010

Superseded by

IEC 62562:2010

US$148.00
Excluding Tax where applicable

FOREWORD
1 Scope
2 Measurement parameters
3 Theory and calculation equations
  3.1 Relative permittivity and loss tangent
  3.2 Temperature dependence of varepsilon and tan delta
  3.3 Cavity parameters
4 Measurement equipment and apparatus
  4.1 Measurement equipment
  4.2 Measurement apparatus for complex permittivity
5 Measurement procedure
  5.1 Preparation of measurement apparatus
  5.2 Measurement of reference level
  5.3 Measurement of cavity parameters: D, H, sigma[r],
      alpha[c], TC[rho]
  5.4 Measurement of complex permittivity of test specimen:
      varepsilon, tan delta
  5.5 Temperature dependence of varepsilon and tan delta
Annex A (informative) Example of measured result and accuracy
  A.1 Cavity parameters
  A.2 Relative permittivity varepsilon and loss tangent tan delta
  A.3 Measurement accuracy
Bibliography

Describes the measurement method of dielectric properties in the planer direction of dielectric plate at microwave frequency in order to develop new materials and to design microwave active and passive devices. This method is called a cavity resonator method.

DocumentType
Miscellaneous Product
Pages
17
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
NEN NPR IEC/PAS 62562 : 2008 Identical
DD IEC PAS 62562 : DRAFT 2008 Identical

US$148.00
Excluding Tax where applicable