IEEE 1149.8.1-2012
Withdrawn
IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components
English
08-09-2012
03-30-2023
1. Overview
2. Normative references
3. Definitions
4. Technology
5. Instructions
6. Pin implementation specifications
7. Toggle_Control register
8. Conformance and documentation requirements
Annex A (informative) - Unpowered testing for open
connections on printed circuit assemblies
Annex B (informative) - Boundary register cells that
support ST-pins and IEEE 1149.6 ac-pins
Annex C (informative) - Bibliography
Describes extensions to IEEE 1149.1[TM] that define the boundary-scan structures and methods required to facilitate boundary-scan-based stimulus of interconnections to passive and/or active components.
| Committee |
Test Technology
|
| DocumentType |
Standard
|
| ISBN |
978-0-7381-7392-4
|
| Pages |
95
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Withdrawn
|
| DEFSTAN 66-031(PT8)/2(2016) : 2016 | REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE |
| IEEE 1149.6-2003 | IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks |
| IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
| IEEE 1149.1-2001 | IEEE Standard Test Access Port and Boundary Scan Architecture |
| IEEE 1149.6-2003 | IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks |
| IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
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