IEEE 1232-1995
Superseded
Superseded
View Superseded by
IEEE Standard for Artificial Intelligence and Expert System Tie to Automatic Test Equipment (AI-ESTATE): Overview and Architecture
Available format(s)
PDF
Language(s)
English
Published date
03-15-1996
Superseded date
07-23-2013
Superseded by
US$188.89
Excluding Tax where applicable
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DocumentType |
Standard
|
| Pages |
32
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy |
Summarise
US$188.89
Excluding Tax where applicable
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