IEEE 1505.1 : 0

Name: IEEE 1505.1 : 0 - COMMON TEST INTERFACE PIN MAP CONFIGURATION FOR HIGH-DENSITY, SINGLE-TIER ELECTRONICS TEST REQUIREMENTS UTILIZING IEEE STD 1505[TM]
Brand: Institute of Electrical & Electronics Engineers

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COMMON TEST INTERFACE PIN MAP CONFIGURATION FOR HIGH-DENSITY, SINGLE-TIER ELECTRONICS TEST REQUIREMENTS UTILIZING IEEE STD 1505[TM]

Available format(s)

Hardcopy , PDF

Language(s)

English

Publisher

Institute of Electrical & Electronics Engineers

Superseded date

10-18-2021

Superseded by

IEEE 1505.1-2008

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Excluding Tax where applicable

DocumentType	Standard
Pages	170
PublisherName	Institute of Electrical & Electronics Engineers
Status	Superseded
SupersededBy	IEEE 1505.1-2008

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IEEE 1505.1 : 0

COMMON TEST INTERFACE PIN MAP CONFIGURATION FOR HIGH-DENSITY, SINGLE-TIER ELECTRONICS TEST REQUIREMENTS UTILIZING IEEE STD 1505[TM]

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