IEEE 1546-2000
Withdrawn
Withdrawn
IEEE Guide for Digital Test Interchange Format (DTIF) Application
Available format(s)
PDF
Language(s)
English
Published date
03-23-2001
Withdrawn date
03-24-2022
US$150.88
Excluding Tax where applicable
An aid in the understanding and use of digital test interchange format (DTIF) files is provided in this guide.
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DevelopmentNote |
Supersedes IEEE DRAFT 1546 (04/2001)
|
| DocumentType |
Standard
|
| Pages |
38
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Withdrawn
|
| Supersedes |
| DEFSTAN 66-031(PT8)/2(2016) : 2016 | REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE |
Summarise
US$150.88
Excluding Tax where applicable
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