IEEE 1620.1-2006
Withdrawn
IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
English
11-08-2006
03-30-2023
1 Overview
1.1 Scope
1.2 Purpose
1.3 Electrical characterization overview
2 Definitions, abbreviations and acronyms
2.1 Definitions
2.2 Acronyms
3 Standard ring oscillator characterization procedures
3.1 Circuit layout
3.2 Guidelines for the ring oscillator characterization process
3.3 Other applicable standards
3.4 Reporting data
3.5 Environmental control and standards
Annex A (informative) Bibliography
Recommended methods and standardized reporting practices for electricalcharacterization of printed and organic ring oscillators are covered.
| Committee |
Microprocessor Standards Committee
|
| DevelopmentNote |
Supersedes IEEE DRAFT 1620.1. (11/2006) Also numbered as IEC 62860-1. (08/2013)
|
| DocumentType |
Standard
|
| ISBN |
978-0-7381-5011-6
|
| Pages |
16
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Withdrawn
|
| IEEE 1139-2008 | IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities |
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