IEEE 1696-2013
Withdrawn
IEEE Standard for Terminology and Test Methods for Circuit Probes
Hardcopy , PDF
English
02-14-2014
03-21-2024
1 Overview
2 Normative references
3 Definitions, abbreviations, and acronyms
4 Special terms
5 Instrumentation
6 Test fixture
7 Performance parameters
Gives test method(s) and specifies transfer (artifact) standards for characterizing electrical circuit probes and probes systems.
| Committee |
TC10 - Waveform Generation Measurement and An
|
| DocumentType |
Standard
|
| ISBN |
978-0-7381-8878-2
|
| Pages |
65
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Withdrawn
|
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| IEEE 1057-2007 REDLINE | IEEE Standard for Digitizing Waveform Recorders |
| IEEE 181-2011 | IEEE Standard for Transitions, Pulses, and Related Waveforms |
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