IEEE C62.37 : 1996
Withdrawn
TEST SPECIFICATION FOR THYRISTOR DIODE SURGE PROTECTIVE DEVICES
01-01-1996
10-17-2023
1 Overview
1.1 Scope
1.2 Tests
1.3 Applicability and device function
2 Definitions of rated and other parameters
2.1 Rated parameter values
2.2 Definitions
2.3 Additional definitions
2.4 Temperature dependence of parameter
2.5 Gated thyristor surge protective device (SPD)
3 Service condition
3.1 Normal service conditions
3.2 Unusual service conditions
4 Standard design test procedure
4.1 Standard design test criteria
4.2 Statistical analysis
4.3 Thyristor surge protective devices (SPD)
test conditions
4.4 Rating test procedures
4.5 Characteristic test procedures
5 Failure modes
5.1 Degradation failure modes
5.2 Catastrophic failure mode
5.3 "Fail-safe" operation
Annex A (informative) - Thyristor terms
Annex B (informative) - Bibliography
Applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc. These protective devices are designed to limit voltage surges on communication circuits and power circuits operating from a direct current (dc) to 420 Hz. Included in this standard are definitions, service conditions and a series of test criteria for the determining of characteristics of a thyristor SPD. If the characteristics differ with the direction of conduction then each polarity will be specified separately.
| Committee |
IEEE
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| DocumentType |
Standard
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| PublisherName |
Institute of Electrical & Electronics Engineers
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| Status |
Withdrawn
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