IEEE/IEC 61671-2-2016
Current
IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description
Hardcopy , PDF
English
04-08-2016
This standard defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance information.
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DocumentType |
Standard
|
| ISBN |
978-1-5044-0862-2
|
| Pages |
56
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Current
|
| IEEE 1671-2010 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
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