INCITS/ISO/IEC 10373-5 : 1998

1 Scope
2 Normative references
3 Terms and Definitions
4 Default items applicable to the test methods
  4.1 Test environment
  4.2 Pre-conditioning
  4.3 Selection of test methods
  4.4 Default tolerance
  4.5 Total measurement uncertainty
5 Test methods
  5.1 Location of accessible optical area and reference track
      5.1.1 Procedure
      5.1.2 Test report
  5.2 Skew
      5.2.1 Apparatus
      5.2.2 Procedure
      5.2.3 Test report
  5.3 Defects
      5.3.1 Apparatus
      5.3.2 Procedure
      5.5.5 Test report

Defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. Deals with test methods which are specific to optical memory card technology.