ISO 12224-1:1997
Withdrawn
Withdrawn
View Superseded by
Solder wire, solid and flux cored — Specification and test methods — Part 1: Classification and performance requirements
Available format(s)
Hardcopy , PDF
Language(s)
English, French
Published date
06-05-1997
Withdrawn date
04-09-2025
Superseded by
US$96.00
Excluding Tax where applicable
| Committee |
ISO/TC 44/SC 12
|
| DocumentType |
Standard
|
| Pages |
11
|
| PublisherName |
International Organization for Standardization
|
| Status |
Withdrawn
|
| SupersededBy |
| Standards | Relationship |
| NBN EN ISO 12224-1 : 1998 | Identical |
| NEN EN ISO 12224-1 : 1998 | Identical |
| NS EN ISO 12224-1 : 1ED 1998 | Identical |
| I.S. EN ISO 12224-1:1999 | Identical |
| PN EN ISO 12224-1 : 2002 | Identical |
| BS EN ISO 12224-1:1998 | Identical |
| EN ISO 12224-1:1998 | Identical |
| NF EN ISO 12224-1 : 1998 | Identical |
| DIN EN ISO 12224-1:1998-10 | Identical |
| DS EN ISO 12224-1 : 1999 | Identical |
| UNE-EN ISO 12224-1:1999 | Identical |
| BS EN ISO 9455-17:2006 | Soft soldering fluxes. Test methods Surface insulation resistance comb test and electrochemical migration test of flux residues |
| ISO 9455-17:2002 | Soft soldering fluxes — Test methods — Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues |
| EN ISO 9455-17:2006 | Soft soldering fluxes - Test methods - Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues (ISO 9455-17:2002) |
| BS ISO 9455-17 : 2002 AMD 16425 | SOFT SOLDERING FLUXES - TEST METHODS - PART 17: SURFACE INSULATION RESISTANCE COMB TEST AND ELECTROCHEMICAL MIGRATION TEST OF FLUX RESIDUES |
| I.S. EN ISO 9455-17:2006 | SOFT SOLDERING FLUXES - TEST METHODS - PART 17: SURFACE INSULATION RESISTANCE COMB TEST AND ELECTROCHEMICAL MIGRATION TEST OF FLUX RESIDUES |
Summarise
US$96.00
Excluding Tax where applicable