ISO 18452:2005
Current
Current
The latest, up-to-date edition.
Fine ceramics (advanced ceramics, advanced technical ceramics) Determination of thickness of ceramic films by contact-probe profilometer
Available format(s)
PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users , Hardcopy
Language(s)
English, French
Published date
11-16-2005
ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
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