ISO 24173:2024
Current
Current
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
02-09-2024
US$258.00
Excluding Tax where applicable
This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
| DocumentType |
Standard
|
| Pages |
40
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NEN-ISO 24173:2024 | Identical |
Summarise
US$258.00
Excluding Tax where applicable