ISO 8769-2:1996
Withdrawn
Withdrawn
View Superseded by
Reference sources for the calibration of surface contamination monitors — Part 2: Electrons of energy less than 0,15 MeV and photons of energy less than 1,5 MeV
Available format(s)
Hardcopy , PDF
Language(s)
English, French
Published date
11-21-1996
Withdrawn date
09-23-2021
Superseded by
US$96.00
Excluding Tax where applicable
Summarise this standard
AI-generated summary
Specifies the characteristics of reference sources for the calibration of surface contamination monitors that are traceable to national measurement standards. Relates to a series of sources emitting electrones of energy less than 0,15 MeV and photons of energy less than 1,5 MeV.
| Committee |
ISO/TC 85/SC 2
|
| DocumentType |
Standard
|
| Pages |
10
|
| PublisherName |
International Organization for Standardization
|
| Status |
Withdrawn
|
| SupersededBy |
| Standards | Relationship |
| PN ISO 8769-2 : 2005 | Identical |
| NF ISO 8769-2 : 1998 | Identical |
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A newer version of this standard is available.
US$96.00
Excluding Tax where applicable