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ISO 8769-2:1996

Withdrawn

Withdrawn

View Superseded by

Reference sources for the calibration of surface contamination monitors — Part 2: Electrons of energy less than 0,15 MeV and photons of energy less than 1,5 MeV

Available format(s)

Hardcopy , PDF

Language(s)

English, French

Published date

11-21-1996

Withdrawn date

09-23-2021

US$96.00
Excluding Tax where applicable

Specifies the characteristics of reference sources for the calibration of surface contamination monitors that are traceable to national measurement standards. Relates to a series of sources emitting electrones of energy less than 0,15 MeV and photons of energy less than 1,5 MeV.

Committee
ISO/TC 85/SC 2
DocumentType
Standard
Pages
10
PublisherName
International Organization for Standardization
Status
Withdrawn
SupersededBy

Standards Relationship
PN ISO 8769-2 : 2005 Identical
NF ISO 8769-2 : 1998 Identical

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US$96.00
Excluding Tax where applicable