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ISO/FDIS 14594

Superseded

Superseded

Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

02-20-2024

Superseded date

06-07-2024

US$143.00
Excluding Tax where applicable

This document gives general guidelines for the determination of experimental parameters relating to the electron probe, the wavelength spectrometer, and the specimen that need to be taken into account when carrying out electron probe microanalysis. It also defines procedures for the determination of probe current, probe diameter, dead time, wavelength resolution, background, analysis area, analysis depth, and analysis volume.

This document is applicable for the analysis of a well-polished specimen using normal beam incidence.

This document does not apply to energy dispersive X-ray spectroscopy.

Committee
ISO/TC 202/SC 2
DocumentType
Draft
Pages
18
PublisherName
International Organization for Standardization
RevisionOf
Status
Superseded

US$143.00
Excluding Tax where applicable