ISO/IEC 10373-6:2016

Foreword
1 Scope
2 Normative references
3 Terms, definitions, symbols and abbreviated terms
4 Default items applicable to the test methods
5 Apparatus and circuits for test of ISO/IEC 14443-1
  and ISO/IEC 14443-2 parameters
6 Test of ISO/IEC 14443-1 parameters
7 Test of ISO/IEC 14443-2 parameters
8 Test of ISO/IEC 14443-3 and ISO/IEC 14443-4
  parameters
Annex A (normative) - Test PCD antennas
Annex B (informative) - Test PCD Antenna tuning
Annex C (normative) - Sense coil
Annex D (normative) - Reference PICCs
Annex E (normative) - Modulation index and waveform
        analysis tool
Annex F (informative) - Program for the evaluation of the
        spectrum
Annex G (normative) - Additional PICC test methods
Annex H (normative) - Additional PCD test methods
Annex I (normative) - High bit rate selection test methods
        for PCD
Annex J (informative) - Program for EMD level measurements
Annex K (normative) - Test methods for bit rates of
        3fc/4, fc, 3fc/2 and 2fc from PCD to PICC
Annex L (normative) - Frame with error correction test
        methods
Bibliography

ISO/IEC 10373-6:2016 defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. Each test method is cross‑referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies employed in identification card applications.

NOTE 1 Criteria for acceptability do not form part of ISO/IEC 10373-6 :2016, but will be found in the International Standards mentioned above.

NOTE 2 Test methods defined in ISO/IEC 10373-6 :2016 are intended to be performed separately. A given proximity card or object, or proximity coupling device, is not required to pass through all the tests sequentially.

ISO/IEC 10373-6:2016 defines test methods which are specific to proximity cards and objects, and proximity coupling devices and proximity extended devices, defined in ISO/IEC 14443‑1, ISO/IEC 14443‑2, ISO/IEC 14443‑3, and ISO/IEC 14443‑4.

ISO/IEC 10373‑1 defines test methods which are common to one or more integrated circuit card technologies and other parts deal with other technology‑specific tests.