JEDEC JESD 22-C101A:2000
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FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
Published date
11-22-2018
Publisher
Superseded date
11-22-2018
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| DocumentType |
Test Method
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| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Superseded
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| SupersededBy | |
| Supersedes |
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Sorry this product is not available in your region.