JEDEC JESD 22-C101C:2004
Superseded
Superseded
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FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
Published date
01-01-2004
Publisher
Superseded date
11-22-2018
Superseded by
Sorry this product is not available in your region.
| DocumentType |
Revision
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| DSCC V62/25656:2025 | MICROCIRCUIT, LINEAR, BiCMOS, NEAR-DC TO >14GHz, SINGLE-ENDED-TO-DIFFERENTIAL RF AMPLIFIER, MONOLITHIC SILICON |
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