JEDEC JESD 57:1996(R2003)
Superseded
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TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION
Published date
09-01-2003
Publisher
Superseded date
11-23-2018
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| DocumentType |
Revision
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| PublisherName |
JEDEC Solid State Technology Association
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| Status |
Superseded
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