JEDEC JESD 94B : 2015
Superseded
View Superseded by
Application Specific Qualification Using Knowledge Based Test Methodology
Hardcopy , PDF
English
10-01-2015
12-17-2022
The method described in this document applies to all application specific reliability testing for solid state device with known failure mechanisms where the test duration and conditions vary based on application variables.
| DocumentType |
Revision
|
| Pages |
47
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| SAE J3168_202112 | Reliability Physics Analysis of Electrical, Electronic, and Electromechanical Equipment, Modules and Components |
| JEDEC JEP180:2020 | GUIDELINE FOR SWITCHING RELIABILITY EVALUATION PROCEDURES FOR GALLIUM NITRIDE POWER CONVERSION DEVICES |
| JEDEC JESD93A:2022 | MULTICHIP MODULES (MCM) |
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