JEDEC JESD47M:2025
Current
Stress-Test-Driven Qualification of Integrated Circuits
Hardcopy , PDF
English
08-01-2025
This standard describes a baseline set of acceptance tests for use in qualifying electronic devices as new products, a product family, or as products in a process which is being changed.
| DocumentType |
Revision
|
| Pages |
38
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| Supersedes |
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