JEDEC JESD47M:2025
Superseded
View Superseded by
Stress-Test-Driven Qualification of Integrated Circuits
Hardcopy , PDF
English
08-01-2025
08-21-2026
This standard describes a baseline set of acceptance tests for use in qualifying electronic devices as new products, a product family, or as products in a process which is being changed.
| DocumentType |
Revision
|
| Pages |
38
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| PublisherName |
JEDEC Solid State Technology Association
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| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
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