JEDEC JESD61A.01:2007(R2025)
Current
Isothermal Electromigration Test Procedure
Hardcopy , PDF
English
04-01-2025
This document describes a procedure for conducting the ISOthermal accelerated wafer level electromigration Test (ISOT) [1], [2], [3], [4] using computer-controlled instrumentation.
| DocumentType |
Standard
|
| Pages |
48
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| Supersedes |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.