JEDEC JESD78F.02:2023
Current
IC Latch-Up Test
Hardcopy , PDF
English
11-01-2023
This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined latch-up stress.
| Committee |
JC-14.1
|
| DocumentType |
Standard
|
| Pages |
94
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| Supersedes |
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