JIS B 0652:1973
Withdrawn
Instruments for the measurement of surface roughness by the interferometric method
English
12-28-1973
03-20-2008
This Japanese Industrial Standard specifies the instruments for the measurement of surface roughness by interferometric method utilizing the effect of interference fringe produced on the surface microscopically enlarged, hereinafter referred to as the \"instrument\".
| DocumentType |
Standard
|
| Pages |
5
|
| PublisherName |
Japanese Standards Association
|
| Status |
Withdrawn
|
| JIS B 7113:1975 | Photographic sharp-cut glass filters |
| JIS B 7430:1977 | Optical flats |
| JIS B 7143:1977 | Engagement between microscope eyepiece and eyepiece sleeves |
| JIS H 8626:1995 | Electroplated coatings of nickel for engineering purposes and electroformings of nickel |
| JIS B 7545:1982 | Test bars |
| JIS B 7728:2002 | Calibration of force-proving instruments used for the verification of uniaxial testing machines |
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