JIS C 1000-4-11:2003
Withdrawn
Withdrawn
View Superseded by
Electromagnetic compatibility (EMC) -- Part 4: Testing and measuring techniques -- Section 11: Voltage dips, short interruptions and voltage variations immunity tests
Published date
03-20-2003
Publisher
Withdrawn date
10-23-2025
Superseded by
Sorry this product is not available in your region.
| DocumentType |
Standard
|
| ProductNote |
Redesignated by JIS C61000-4-11. (10/2005)
|
| PublisherName |
Japanese Standards Association
|
| Status |
Withdrawn
|
| SupersededBy |
2003 [20/03/2003]
| JIS C 0161:1997 | International Electrotechnical Vocabulary: Electromagnetic compatibility |
| JIS C 1000-6-1:2003 | Electromagnetic compatibility (EMC) -- Part 6: Generic standards -- Section 1: Immunity for residential, commercial and light-industrial environments |
| TR C 0025:2002 | Electromagnetic compatibility (EMC) Part 4: Testing and measurement techniques -- Section 15: Flickermeter -- Functional and design specifications |
| JIS C 1000-6-2:2003 | Electromagnetic compatibility (EMC) -- Part 6: Generic standards -- Section 2: Immunity for industrial environments |
Summarise
Sorry this product is not available in your region.